Chip-off NAND data recovery with Visual NAND reconstructor consists of several essential steps whose task is to reverse transformations which controller applied on user data. In those education webinars, you will find out how to extract raw dumps from NAND memory chips, how to correct them using written ECC codes, how to assemble blocks into a logical order, and much more.
Chip reading, ECC usage, Page layout, Dump reread, Read Retry.
VIDEO
01:34 - NAND chip and NAND adapter types 05:55 - The configuration 08:17 - ID reading. Configuration selection 16:45 - Configuration test. Data quality test 28:52 - The Voltage control 38:34 - How to select a configuration if there are several of them. SDR and DDR protocols 01:03:11 - Case study. Phison controller ECC applying and Page layout setting 01:22:19 - Case study. SM controller ECC applying and Page layout setting 01:25:02 - Case study. AU controller ECC applying and Page layout setting 01:28:40 - Case study. Sandisk controller ECC applying and Page layout setting 01:31:08 - DUMP rereading. How to fix uncorrectable by ECC pages.
The link to PDF presentation:
Bad Column Remover. Case studies.
VIDEO
00:00 - New automated Bad Column Remover 10:27 -
Phison controller bad columns removal 45:58 -
SM controller bad columns removal 56:34 -
AU controller XORed bad columns removal 01:02:06 - Unknown controller 283 bad columns removal
The link for the test cases:
Page structure analysis and reverse engineering of BCH codewords from unsupported devices.
VIDEO
2:03 - NAND page structure 12:03 - Manual Page layout setting in VNR 55:10 - Manual BCH codeword detection 1:06:34 - "Codeword analysis" usage, BCH codeword Bruteforce 1:18:50 - Case study. Manual PAGE layout setting and BCH codeword detection for SM controller 1:24:26 - ECC size and position detection in fully XORed page 1:34:50 - SM service area ECC detection 1:43:32 - Case study. Manual PAGE layout setting and BCH codeword detection for AU controller 1:54:50 - Case study. Manual PAGE layout setting and BCH codeword detection for SanDisk controller
The link to PDF presentation:
Inversion. Data transformation analysis. XOR, XOR analyser.
VIDEO
8:28 - Inversion detection. Data transformation analysis 14:58 - Case study. Inversion is not used 24:42 - Case study. Inversion is used 34:05 - XOR analysis. XOR analyzer 1:07:52 - Case study. XOR transformation elimination. SM controller 1:17:32 - Case study. XOR transformation elimination. AU controller 1:21:50 - XOR key extraction from a patient dump (overview) 1:24:35 - Case study. XOR transformation elimination. SanDisk controller 1:32:47 - Case study. Dynamic XOR transformation elimination. Phison controller 1:36:13 - Logical block size check and adjustment 1:44:39 - "Adjust key to page layout" explanation
The link to PDF presentation:
XOR key extraction from the dump. XOR key adjustment. XORed SA.
VIDEO
0:33 - Data
Scrambling (XOR) 1:18 - Descrambling
(XOR elimination) 4:41 - XOR
key extraction 28:52 - Adjust
key to the page layout 31:58 - Case
study. XOR key extraction, Phison controller 34:20 - Number
of Xor keys in one block determination 44:26 - Case
study. XOR key extraction, SM controller 46:09 - XOR
key signature 58:54 - Existing
XOR key from database fitting. XOR key size adjustment. 1:09:46 - Case
study. XOR key size adjustment. SA XOR key extraction.
The link to the PDF:
Multi-Plane page allocation. Pair and Unite usage.
VIDEO
1:21 - NAND memory internal structure 2:51 - Page allocation modes 10:34 -NAND chip block reading/ the reason of page mix in a dump 11:52 - Single-plane page allocation in a dump 12:33 - Multi-plane page allocation in a dump/ PAIR element 17:27 - Multi-plane page allocation detection 25:46 - Multi-plane page allocation on the chip level/ UNITE element 39:05 - Case study. One dump. PAIR is used. 53:15 - Case study. Two dumps. PAIR is NOT used. Unite by DUMPS is applied. 1:00:22 - Case study. Two dumps. PAIR is used. UNITE by PAGES is applied. 1:12:04 - Case study. Four dumps. PAIR is used. UNITE by PAGES and then UNITE by DUMPS are applied. 1:21:51 - Case study. Four dumps. PAIR is used. UNITE by PAGES is used. 1:26:27 - Order of dumps for the UNITE detection
Link to the PDF presentation and test cases:
Block management. LBN, headers, Marker table.
VIDEO
0:00 -
NAND Data recovery process review 5:26 -
Block management explanation 20:25 -
The Logical block number 27:26 -
LBN Little-endian order 29:03 -
The LBN and header location in the service area. 32:15 -
Block management step-by-step script 37:07 -
NAND Data recovery case step-by-step demonstration in the VNR 39:25 -
BCH element usage in the VNR 41:53 -
Page layout determination 46:06 -
XOR analyzer usage 48:39 -
Multiplane page allocation. PAIR element usage 51:20 -
PS2251-50-F Block management 52:19 -
The LBN and header search in the SA (Phison controller) 1:04:22 - Filtering by Header (Phison controller) 1:22:18 -
SM3255QAB Block management 1:24:28 -
The LBN and header search in the SA (SM controller) 1:34:48 -
Filtering by Header (SM controller), Header range determination 2:08:12 -
SM321QF AC Block management 2:09:35 -
Can't see the header and LBN precisely 2:24:33 -
LBN little-endian order example 2:43:08 -
Particular file block number detection 2:45:54 -
AU6989SN Block management 2:49:24 -
XORed bad columns removal 3:01:44 -
Correct data block selection when there is no header 3:08:12 -
Non-standard LBN chain test step
The link to the PDF presentation:
Related Articles
Silicon Motion(SM) controllers - Data recovery We can find plenty of NAND controllers on the market and without any doubt one of the most popular is SiliconMotion. These controllers found their use in all kinds of flash devices, starting from USB flash drives, SD cards, monolithic devices, and ...
Alcor Micro(AU) controllers - Peculiarities of data recovery Alcor Micro (AU) controllers are found in all sorts of devices such as microSD cards, USB flash drives, SD cards of any package, and especially monolithic devices. They are very popular in cheap, refurbished, and fake devices as well. Recent models ...
Binary patterns in NAND flash memory Analysis and recognition of binary patterns in NAND flash memory is the key step in chip-off data recovery and digital forensic analysis of broken flash devices. This analysis is carried out in the Bitmap mode since the classic HEX view does not ...
Missing data planes in TSOP48, LGA52, BGA132 and BGA152 Sandisk chips. This article shows the way how to extract all data from TSOP48, LGA52, and BGA132/152 Sandisk memory chips when the configuration and dump size are correct, but half of the dump is still empty. Usually, if a NAND memory chip has 2 or 4 crystals, ...
ECC in NAND flash memory All modern flash storage devices have a problem with data integrity caused by a poor quality of the NAND chips. This problem is well known as “Bit errors”. When bit errors appear within the area where file is stored, it gets corrupted and unreadable. ...